1． 老化房确保老化的运行情况与期望相符。通过监测老化板上的每个器件，可在老化一开始时就先更换已经坏了的器件，这样使用者可确保老化板和老化系统按预先设想的状况运行，没有产能上的浪费。2． 及时对生产工艺作出反馈。器件故障有时直接对应于某个制造工艺或者某生产设备，在故障发生时及时了解信息可立刻解决可能存在的工艺缺陷，避免制造出大量不合格产品。
1. The aging room ensures that the aging operation is in line with expectations. By monitoring each device on the aging board, the damaged device can be replaced at the beginning of the aging process, so that users can ensure that the aging board and the aging system operate in a pre-conceived condition without waste of production capacity. 2. Feedback on production process in time. Device faults sometimes directly correspond to a manufacturing process or a production equipment. When the faults occur, timely information can be obtained to immediately solve the possible process defects and avoid the production of a large number of substandard products. 3． 达到预期故障率的实际老化时间相对更短。过去器件进行首批老化时都要先经过168小时，这是人们期望发现所有早期故障的标准起始时间，而这完全是因为手头没有新器件数据所致。在随后的半年期间，这个时间会不断缩短，直到用实验和误差分析方法得到实际所需的老化时间为止。在老化同时进行测试则可以通过检查老化系统生成的实时记录及时发现产生的故障。尽快掌握老化时间可提高产量，降低器件成本。
3. The actual aging time to reach the expected failure rate is relatively shorter. In the past, it took 168 hours for the first batch of devices to age, which was the standard starting time for all early failures to be detected, because there was no new device data on hand. In the following six months, this time will be shortened until the actual aging time is obtained by experiment and error analysis method. Testing at the same time of aging can detect the faults in time by checking the real-time records generated by the aging system. Mastering aging time as soon as possible can increase output and reduce device cost.
4． 将耗时的功能测试移到老化中可以节约昂贵的高速测试仪器的时间。如果老化后只进行参数测试及很少的功能测试，那么用现有设备可测试更多器件，仅此一点即可抵消因采用老化测试方案而发生的费用。
4. Moving time-consuming functional testing to aging can save time for expensive high-speed testing instruments. If only parameter tests and few functional tests are performed after aging, more devices can be tested with existing equipment, which can offset the cost of adopting aging test schemes.
